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Merged PR 19663: Modified the decrease lot qty functionality to reduce qty via test wafer usag...

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Modified the decrease lot qty functionality to reduce qty via test wafer usage rather than directly reducing the qty.,
This commit is contained in:
Ouellette Jonathan (CSC FI SPS MESLEO)
2025-06-27 21:39:06 +02:00
parent 60b5386f27
commit a878c9bb2e
1 changed files with 3 additions and 3 deletions
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6
LSL2/STPROC/NDW_ADJUST_LOT_QTY_EVENTS.txt
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@ -126,12 +126,11 @@ Event PUB_SUBMIT.CLICK()
Begin Case
Case NewWfrQty LT CurrWfrQty
AmountToDecrease = CurrWfrQty - NewWfrQty
Lot_Services('ReduceLotWaferCount', LotId, AmountToDecrease, @User4)
PSNNo = Xlate('RDS', LotID, 'PROD_SPEC_ID', 'X')
Test_Run_Services('CreateTestRunRecord', 13, '', '', PSNNo, '', @User4, LotID, NewWfrQty, True$)
If Error_Services('NoError') then
Lot_Event_Services('CreateLotEvent', LotId, Datetime(), 'COMMENT', 'Manual Lot Qty decrease performed.', '', @User4, '' , '')
end
PSNNo = Xlate('RDS', LotID, 'PROD_SPEC_ID', 'X')
Test_Run_Services('CreateTestRunRecord', 13, '', '', PSNNo, '', @User4, LotID, NewWfrQty, True$)
Case NewWfrQty GT CurrWfrQty
AmountToIncrease = NewWfrQty - CurrWfrQty
Lot_Services('IncreaseLotWaferCount', LotId, AmountToIncrease, @User4)
@ -194,3 +193,4 @@ return