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Fixed bug in Test Wafer Usage Form

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Infineon\Ouellette 2024-11-21 13:18:55 -07:00 committed by Ouellette Jonathan (CSC FI SPS MESLEO)
parent e4cca79a08
commit 90d714c9f2
1 changed files with 1 additions and 1 deletions
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2
LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt
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@ -26,7 +26,7 @@ Event WINDOW.CREATE(CreateParam)
PlaceDialog(-2, -2)
Set_Property(@Window, 'VISIBLE', 1)
GoSub FillFormMasterData
PresetRDSNo = ''
RDSNo = ''
PresetTestType = ''
PresetEquipmentType = ''
PresetEquipmentId = ''