From 90d714c9f29d7661239eda0312154da95b84d5cf Mon Sep 17 00:00:00 2001
From: "Infineon\\Ouellette" <jonathan.ouellette@infineon.com>
Date: Thu, 21 Nov 2024 13:18:55 -0700
Subject: [PATCH] Fixed bug in Test Wafer Usage Form

---
 LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt b/LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt
index 8849834..87e6b4d 100644
--- a/LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt
+++ b/LSL2/STPROC/NDW_LOG_TEST_WAFER_USAGE_EVENTS.txt
@@ -26,7 +26,7 @@ Event WINDOW.CREATE(CreateParam)
     PlaceDialog(-2, -2)
     Set_Property(@Window, 'VISIBLE', 1)
     GoSub FillFormMasterData
-    PresetRDSNo         = ''
+    RDSNo               = ''
     PresetTestType      = ''
     PresetEquipmentType = ''
     PresetEquipmentId   = ''