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Reworded the error to be inclusive of all missing metrology results from WO_MAT_QA record

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Infineon\Ouellette
2025-08-18 15:01:04 -07:00
parent 60522d74c1
commit 89bb3e479b
1 changed files with 2 additions and 1 deletions
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LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt
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@ -348,7 +348,7 @@ Event EDL_CASS_BARCODE.LOSTFOCUS(Flag, FocusID)
ErrorMsg = Error_Services('GetMessage') ErrorMsg = Error_Services('GetMessage')
end end
end else end else
ErrorMsg = 'Wafer Counter Operation Not Allowed. QA Metrology Incomplete.' ErrorMsg = 'Wafer Counter Operation Not Allowed. A Metrology stage is incomplete.'
end end
Case RowExists('WM_OUT', CassetteID) Case RowExists('WM_OUT', CassetteID)
@ -628,3 +628,4 @@ return