From 89bb3e479b8017a05ce9053eef6e6329f9c1b618 Mon Sep 17 00:00:00 2001 From: "Infineon\\Ouellette" Date: Mon, 18 Aug 2025 15:01:04 -0700 Subject: [PATCH] Reworded the error to be inclusive of all missing metrology results from WO_MAT_QA record --- LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt | 3 ++- 1 file changed, 2 insertions(+), 1 deletion(-) diff --git a/LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt b/LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt index 63d4eb1..599a6f4 100644 --- a/LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt +++ b/LSL2/STPROC/NDW_WAFER_COUNTER_EVENTS.txt @@ -348,7 +348,7 @@ Event EDL_CASS_BARCODE.LOSTFOCUS(Flag, FocusID) ErrorMsg = Error_Services('GetMessage') end end else - ErrorMsg = 'Wafer Counter Operation Not Allowed. QA Metrology Incomplete.' + ErrorMsg = 'Wafer Counter Operation Not Allowed. A Metrology stage is incomplete.' end Case RowExists('WM_OUT', CassetteID) @@ -628,3 +628,4 @@ return +