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Added a condition that Wafer type for metrology reading is not null to determine if a test wafer is required.

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Infineon\Ouellette 2025-06-07 22:04:48 -07:00
parent e5f0e9b7f1
commit 2a28c4b743
1 changed files with 2 additions and 1 deletions
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LSL2/STPROC/RDS_SERVICES.txt
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@ -809,7 +809,7 @@ Service IsTWLoggingReqd(RDSNo)
Layer = Field(PRSPropKey, '*', 2) Layer = Field(PRSPropKey, '*', 2)
MeasureFreq = PRSPropRec<PRS_PROP_FREQ$> MeasureFreq = PRSPropRec<PRS_PROP_FREQ$>
Start = PRSPropRec<PRS_PROP_MET_START$> Start = PRSPropRec<PRS_PROP_MET_START$>
If WaferType NE 'Product' AND WaferType NE 'Prod' then If WaferType NE 'Product' AND WaferType NE 'Prod' AND WaferType NE '' then
BEGIN CASE BEGIN CASE
CASE MeasureFreq = 'F' AND ThisReactorRunOrder = 1 ; IsTWReqd = 1 CASE MeasureFreq = 'F' AND ThisReactorRunOrder = 1 ; IsTWReqd = 1
CASE ThisReactorRunOrder = Start ; IsTWReqd = 1 CASE ThisReactorRunOrder = Start ; IsTWReqd = 1
@ -1828,3 +1828,4 @@ return