From 2a28c4b7433529fcdd769e39919fe482d89a2dc8 Mon Sep 17 00:00:00 2001
From: "Infineon\\Ouellette" <jonathan.ouellette@infineon.com>
Date: Sat, 7 Jun 2025 22:04:48 -0700
Subject: [PATCH] Added a condition that Wafer type for metrology reading is
 not null to determine if a test wafer is required.

---
 LSL2/STPROC/RDS_SERVICES.txt | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)

diff --git a/LSL2/STPROC/RDS_SERVICES.txt b/LSL2/STPROC/RDS_SERVICES.txt
index 80f4a5f..f4e4ee9 100644
--- a/LSL2/STPROC/RDS_SERVICES.txt
+++ b/LSL2/STPROC/RDS_SERVICES.txt
@@ -809,7 +809,7 @@ Service IsTWLoggingReqd(RDSNo)
                 Layer = Field(PRSPropKey, '*', 2)
                 MeasureFreq = PRSPropRec<PRS_PROP_FREQ$>
                 Start = PRSPropRec<PRS_PROP_MET_START$>
-                If WaferType NE 'Product' AND WaferType NE 'Prod' then
+                If WaferType NE 'Product' AND WaferType NE 'Prod' AND WaferType NE '' then
                     BEGIN CASE
                         CASE MeasureFreq = 'F' AND ThisReactorRunOrder = 1	; IsTWReqd = 1
                         CASE ThisReactorRunOrder = Start					; IsTWReqd = 1
@@ -1828,3 +1828,4 @@ return
 
 
 
+