9766e38a93
1. Implemented an auto enter for test wafer usage form. 2. Implemented a keep open flag for test wafer usage. 3. Changed mapping for Log A Test Run Button on NDW_MAIN form to new test wafer form. 4. Implemented a cast for Lot ID string in Log Test Wafer Usage form to ensure all data is upper case. Related work items: #247309, #247310, #247870, #248319