Needed Friday bugfix. Added in missing CHANGED event on CMB_EQUIP_TYPE. Also fixed initialization of this field. Cleaned up formatting
Related work items: #255186
1. Implemented an auto enter for test wafer usage form.
2. Implemented a keep open flag for test wafer usage.
3. Changed mapping for Log A Test Run Button on NDW_MAIN form to new test wafer form.
4. Implemented a cast for Lot ID string in Log Test Wafer Usage form to ensure all data is upper case.
Related work items: #247309, #247310, #247870, #248319
Includes services and functions to create new
test wafer lot. Tables included outside of git push
New Tables:
1. LOT
2. LOT_EVENT
3. LOT_OPERATION
4. PRODUCT_OPERATION
5. OPERATION
6. Added PRODUCT_OPERATIONS field in TEST_WAFER_PROD table.
All relational indexes and btree indexes.
