Modified QA met complete check before wafer counter to only apply to FQA location scans
This commit is contained in:
Infineon\StieberD
committed by
Stieber Daniel (CSC FI SPS MESLEO)
Stieber Daniel (CSC FI SPS MESLEO)
parent
9d6c4c154f
commit
c183da951a
@ -97,16 +97,6 @@ Event WINDOW.CREATE(CreateParam)
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LogData<5> = ToolLoc
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LogData<6> = @Window:'.CREATE'
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Logging_Services('AppendLog', objLog, LogData, @RM, @FM)
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QAMetComplete = ''
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If CassID NE '' then
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If RowExists('WM_OUT', CassID) then
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WOMatKey = Xlate('WM_OUT', CassID, 'WO_MAT_KEY', 'X')
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end else
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WOMatKey = Xlate('RDS', CassID, 'WO_MAT_KEY', 'X')
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end
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QAMetComplete = Wo_Mat_Qa_Services('GetQAMetComplete', WOMatKey)
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end
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Convert '.' to '*' in CassID
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ExpectedQty = ''
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@ -115,8 +105,6 @@ Event WINDOW.CREATE(CreateParam)
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Set_Property(@Window:'.EDL_CASS_ID', 'TEXT', CassID)
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Begin Case
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Case (CassID NE '' AND QAMetComplete EQ False$)
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ErrorMsg = 'Wafer Counter Operation Not Allowed. QA Metrology Incomplete.'
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Case ( (CassID EQ '') and (ToolLoc EQ '') )
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// Alternate workflow
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass ID')
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@ -333,41 +321,31 @@ Event EDL_CASS_BARCODE.LOSTFOCUS(Flag, FocusID)
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Begin Case
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Case RowExists('RDS', CassetteID)
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WOMatKey = Xlate('RDS', CassetteID, 'WO_MAT_KEY', 'X')
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QAMetComplete = Wo_Mat_Qa_Services('GetQAMetComplete', WOMatKey)
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If QAMetComplete EQ True$ then
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ExpectedQty = Xlate('RDS', CassetteID, 'WFRS_OUT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass RDS')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass RDS 2D')
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ExpectedQty = Xlate('RDS', CassetteID, 'WFRS_OUT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass RDS')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass RDS 2D')
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WOMatKey = Xlate('RDS', CassetteID, 'WO_MAT_KEY', 'X')
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CurrWfrMap = WO_Mat_Services('GetWaferMap', WOMatKey)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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WOMatKey = Xlate('RDS', CassetteID, 'WO_MAT_KEY', 'X')
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CurrWfrMap = WO_Mat_Services('GetWaferMap', WOMatKey)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = 'Wafer Counter Operation Not Allowed. A Metrology stage is incomplete.'
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ErrorMsg = Error_Services('GetMessage')
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end
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Case RowExists('WM_OUT', CassetteID)
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WOMatKey = Xlate('WM_OUT', CassetteID, 'WO_MAT_KEY', 'X')
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QAMetComplete = Wo_Mat_Qa_Services('GetQAMetComplete', WOMatKey)
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If QAMetComplete EQ True$ then
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ExpectedQty = Xlate('WM_OUT', CassetteID, 'WAFER_CNT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass WMO')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass WMO 2D')
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ExpectedQty = Xlate('WM_OUT', CassetteID, 'WAFER_CNT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass WMO')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass WMO 2D')
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CurrWfrMap = WM_Out_Services('GetWaferMap', CassetteID)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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CurrWfrMap = WM_Out_Services('GetWaferMap', CassetteID)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = 'Wafer Counter Operation Not Allowed. QA Metrology Incomplete.'
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ErrorMsg = Error_Services('GetMessage')
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end
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End Case
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@ -438,110 +416,155 @@ Event EDL_TOOL_BARCODE.LOSTFOCUS(Flag, FocusID)
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Cnt = DCount(ScanData, '|')
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If Cnt EQ 2 then
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WaferSize = Field(ScanData, '|', 1)
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Area = Field(ScanData, '|', 2)
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Def = ""
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Def<MTEXT$> = "Retreiving Wafer Counter Data..."
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Def<MTYPE$> = "U"
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CassID = Get_Property(@Window:'.EDL_CASS_BARCODE', 'TEXT')
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MsgUp = Msg(@window, Def) ;* display the processing message
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WcJson = Wafer_Counter_Services('GetWaferCounterJSON', WaferSize, Area, CassID)
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Msg(@window, MsgUp) ;* take down the processing message
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If Error_Services('NoError') then
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objJSON = ''
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If SRP_JSON(objJSON, 'Parse', WcJson) EQ '' then
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ScanDtm = SRP_JSON(objJSON, 'GetValue', 'dateTimeFormatted')
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ToolID = SRP_JSON(objJSON, 'GetValue', 'equipmentId')
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WaferCount = SRP_JSON(objJSON, 'GetValue', 'total')
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SlotMap = SRP_JSON(objJSON, 'GetValue', 'slotMap')
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SRP_JSON(objJSON, 'Release')
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Wafer_Counter_Services('AddScan', CassID, WaferCount, ScanDtm, ToolID, @User4, Area, SlotMap)
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If Error_Services('NoError') then
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Set_Property(@Window:'.EDL_SCAN_DTM', 'TEXT', ScanDtm)
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Set_Property(@Window:'.EDL_TOOL_ID', 'TEXT', ToolID)
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Set_Property(@Window:'.EDL_WAFER_COUNT', 'TEXT', WaferCount)
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EmptyColorArray = RED$ : @FM : '' : @FM : '' : @FM : ''
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FilledColorArray = GREEN$ : @FM : '' : @FM : '' : @FM : ''
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RowIndex = 1
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ResultArray = ''
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ExpectedWfrMap = Get_Property(@Window, '@EXPECTED_WFR_MAP')
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Area = Field(ScanData, '|', 2) ; // This is a proxy for the operation being performed
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For SlotIndex = 1 to 25
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SlotFilled = SlotMap[SlotIndex, 1]
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If Area EQ 'FQA' then
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CassetteID = Get_Property(@Window:'.EDL_CASS_ID', 'TEXT')
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Begin Case
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Case RowExists('RDS', CassetteID)
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WOMatKey = Xlate('RDS', CassetteID, 'WO_MAT_KEY', 'X')
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QAMetComplete = Wo_Mat_Qa_Services('GetQAMetComplete', WOMatKey)
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If QAMetComplete EQ True$ then
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ExpectedQty = Xlate('RDS', CassetteID, 'WFRS_OUT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass RDS')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass RDS 2D')
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ExpectedVal = ExpectedWfrMap[SlotIndex, 1]
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ResultArray<1, SlotIndex> = 26 - SlotIndex
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If SlotFilled EQ ExpectedVal then
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ResultArray<2, SlotIndex> = ''
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end else
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ResultArray<2, SlotIndex> = 'Error'
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end
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WOMatKey = Xlate('RDS', CassetteID, 'WO_MAT_KEY', 'X')
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CurrWfrMap = WO_Mat_Services('GetWaferMap', WOMatKey)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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end else
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ErrorMsg = 'Wafer Counter Operation Not Allowed. A Metrology stage is incomplete.'
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end
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Case RowExists('WM_OUT', CassetteID)
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WOMatKey = Xlate('WM_OUT', CassetteID, 'WO_MAT_KEY', 'X')
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QAMetComplete = Wo_Mat_Qa_Services('GetQAMetComplete', WOMatKey)
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If QAMetComplete EQ True$ then
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ExpectedQty = Xlate('WM_OUT', CassetteID, 'WAFER_CNT', 'X')
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Set_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT', ExpectedQty)
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Set_Property(@Window:'.LBL_CASS_ID', 'TEXT', 'Cass WMO')
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Set_Property(@Window:'.LBL_CASS_BARCODE', 'TEXT', 'Cass WMO 2D')
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RowIndex += 1
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Next SlotIndex
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ExpectedQty = Get_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT')
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Set_Property(@Window:'.EDT_WAFER_COUNTER', 'ARRAY', ResultArray)
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RowIndex = 1
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For SlotIndex = 1 to 25
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SlotFilled = SlotMap[SlotIndex, 1]
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If SlotFilled then
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CellColorArray = FilledColorArray
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end else
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CellColorArray = EmptyColorArray
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end
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Send_Message(@Window:'.EDT_WAFER_COUNTER', 'COLOR_BY_POS', 2, RowIndex, CellColorArray)
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RowIndex += 1
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Next SlotIndex
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Begin Case
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Case WaferCount NE ExpectedQty
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ErrorMsg = 'Scanned wafer count "':WaferCount:'" does not match expected quantity "':ExpectedQty:'".'
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Case SlotMap NE ExpectedWfrMap
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ErrorMsg = 'Scanned wafer map does not match expected wafer map.'
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Case Otherwise$
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SuccessMessage = 'Wafer count verification complete!'
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LogData = ''
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LogData<1> = OConv(Datetime(), 'DT2/^H')
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LogData<2> = @User4
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LogData<3> = SuccessMessage
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Logging_Services('AppendLog', objLog, LogData, @RM, @FM)
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MsgStruct = ""
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MsgStruct<MTEXTWIDTH$> = MSG_WIDTH$
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MsgStruct<MCOL$> = -300
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MsgStruct<MROW$> = 500
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MsgStruct<MTYPE$> = "T4"
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Msg(@Window, MsgStruct, 'PROCESS_COMPLETE', '', SuccessMessage)
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AltFlow = Get_Property(@Window, '@ALTERNATE')
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If AltFlow then
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GoSub ClearForm
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end else
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End_Dialog(@Window, True$)
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end
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End Case
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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end else
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ErrorMsg = 'Error parsing tool scan data.'
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end
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end else
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ErrorMsg = Error_Services('GetMessage')
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CurrWfrMap = WM_Out_Services('GetWaferMap', CassetteID)
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If Error_Services('NoError') then
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ExpectedWfrMap = CurrWfrMap
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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end else
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ErrorMsg = 'Wafer Counter Operation Not Allowed. QA Metrology Incomplete.'
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end
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End Case
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end
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If ErrorMsg EQ '' then
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Def = ""
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Def<MTEXT$> = "Retreiving Wafer Counter Data..."
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Def<MTYPE$> = "U"
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CassID = Get_Property(@Window:'.EDL_CASS_BARCODE', 'TEXT')
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MsgUp = Msg(@window, Def) ;* display the processing message
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WcJson = Wafer_Counter_Services('GetWaferCounterJSON', WaferSize, Area, CassID)
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Msg(@window, MsgUp) ;* take down the processing message
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If Error_Services('NoError') then
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objJSON = ''
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If SRP_JSON(objJSON, 'Parse', WcJson) EQ '' then
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ScanDtm = SRP_JSON(objJSON, 'GetValue', 'dateTimeFormatted')
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ToolID = SRP_JSON(objJSON, 'GetValue', 'equipmentId')
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WaferCount = SRP_JSON(objJSON, 'GetValue', 'total')
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SlotMap = SRP_JSON(objJSON, 'GetValue', 'slotMap')
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SRP_JSON(objJSON, 'Release')
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Wafer_Counter_Services('AddScan', CassID, WaferCount, ScanDtm, ToolID, @User4, Area, SlotMap)
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If Error_Services('NoError') then
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Set_Property(@Window:'.EDL_SCAN_DTM', 'TEXT', ScanDtm)
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Set_Property(@Window:'.EDL_TOOL_ID', 'TEXT', ToolID)
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Set_Property(@Window:'.EDL_WAFER_COUNT', 'TEXT', WaferCount)
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EmptyColorArray = RED$ : @FM : '' : @FM : '' : @FM : ''
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FilledColorArray = GREEN$ : @FM : '' : @FM : '' : @FM : ''
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RowIndex = 1
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ResultArray = ''
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ExpectedWfrMap = Get_Property(@Window, '@EXPECTED_WFR_MAP')
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For SlotIndex = 1 to 25
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SlotFilled = SlotMap[SlotIndex, 1]
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ExpectedVal = ExpectedWfrMap[SlotIndex, 1]
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ResultArray<1, SlotIndex> = 26 - SlotIndex
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If SlotFilled EQ ExpectedVal then
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ResultArray<2, SlotIndex> = ''
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end else
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ResultArray<2, SlotIndex> = 'Error'
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end
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RowIndex += 1
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Next SlotIndex
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ExpectedQty = Get_Property(@Window:'.EDL_EXPECTED_QTY', 'TEXT')
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Set_Property(@Window:'.EDT_WAFER_COUNTER', 'ARRAY', ResultArray)
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RowIndex = 1
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For SlotIndex = 1 to 25
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SlotFilled = SlotMap[SlotIndex, 1]
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If SlotFilled then
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CellColorArray = FilledColorArray
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end else
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CellColorArray = EmptyColorArray
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end
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Send_Message(@Window:'.EDT_WAFER_COUNTER', 'COLOR_BY_POS', 2, RowIndex, CellColorArray)
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RowIndex += 1
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Next SlotIndex
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Begin Case
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Case WaferCount NE ExpectedQty
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ErrorMsg = 'Scanned wafer count "':WaferCount:'" does not match expected quantity "':ExpectedQty:'".'
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Case SlotMap NE ExpectedWfrMap
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ErrorMsg = 'Scanned wafer map does not match expected wafer map.'
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Case Otherwise$
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SuccessMessage = 'Wafer count verification complete!'
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LogData = ''
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LogData<1> = OConv(Datetime(), 'DT2/^H')
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LogData<2> = @User4
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LogData<3> = SuccessMessage
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Logging_Services('AppendLog', objLog, LogData, @RM, @FM)
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MsgStruct = ""
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MsgStruct<MTEXTWIDTH$> = MSG_WIDTH$
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MsgStruct<MCOL$> = -300
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MsgStruct<MROW$> = 500
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MsgStruct<MTYPE$> = "T4"
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Msg(@Window, MsgStruct, 'PROCESS_COMPLETE', '', SuccessMessage)
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AltFlow = Get_Property(@Window, '@ALTERNATE')
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If AltFlow then
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GoSub ClearForm
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end else
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End_Dialog(@Window, True$)
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end
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End Case
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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end else
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ErrorMsg = 'Error parsing tool scan data.'
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end
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end else
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ErrorMsg = Error_Services('GetMessage')
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end
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end
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end else
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ErrorMsg = 'Invalid Tool Barcode Scan.'
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end
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end else
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LogData = ''
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LogData<1> = OConv(Datetime(), 'DT2/^H')
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LogData<2> = @User4
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LogData<3> = 'Verification process canceled'
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Logging_Services('AppendLog', objLog, LogData, @RM, @FM)
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End_Dialog(@Window, False$)
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end
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If ErrorMsg NE '' then
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@ -624,9 +647,3 @@ ClearForm:
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return
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Reference in New Issue
Block a user