phares3757/open-insight
3
0
Fork 0
Code Issues Pull Requests Actions Packages Projects Releases Wiki Activity

Merged PR 13910: Implemented an auto enter for test wafer usage form. Implemented a keep open...

Browse Source 
1. Implemented an auto enter for test wafer usage form.
2. Implemented a keep open flag for test wafer usage.
3. Changed mapping for Log A Test Run Button on NDW_MAIN form to new test wafer form.
4. Implemented a cast for Lot ID string in Log Test Wafer Usage form to ensure all data is upper case.

Related work items: #247309, #247310, #247870, #248319
This commit is contained in:
Ouellette Jonathan (CSC FI SPS MESLEO)
2025-03-27 21:44:04 +01:00
parent b76db6bc72
commit 9766e38a93
2 changed files with 26 additions and 8 deletions
Download Patch File Download Diff File Expand all files Collapse all files

3
LSL2/STPROC/NDW_MAIN_EVENTS.txt
View File

@ -674,7 +674,7 @@ end event
Event OLE_LOG_TEST_RUN.OnClick(Point, Button, Shift, Ctrl)
rv = Start_Window('NDW_TEST_RUN', '')
rv = Start_Window('NDW_LOG_TEST_WAFER_USAGE', '')
end event
@ -849,3 +849,4 @@ FixFont:
return