Initial addition for Test Wafer Tracking Phase 2

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Includes services and functions to create new
test wafer lot. Tables included outside of git push
New Tables:
1. LOT
2. LOT_EVENT
3. LOT_OPERATION
4. PRODUCT_OPERATION
5. OPERATION
6. Added PRODUCT_OPERATIONS field in TEST_WAFER_PROD table.
All relational indexes and btree indexes.

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This commit is contained in:

Infineon\Ouellette

2024-10-24 11:19:28 -07:00

committed by Ouellette Jonathan (CSC FI SPS MESLEO)

parent f2a8ce4116

commit 9651c48539

22 changed files with 10609 additions and 9 deletions

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LSL2/OIWIN/NDW_VIEW_LOT.json Normal file

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