Initial addition for Test Wafer Tracking Phase 2

Browse Source

Includes services and functions to create new
test wafer lot. Tables included outside of git push
New Tables:
1. LOT
2. LOT_EVENT
3. LOT_OPERATION
4. PRODUCT_OPERATION
5. OPERATION
6. Added PRODUCT_OPERATIONS field in TEST_WAFER_PROD table.
All relational indexes and btree indexes.

...

This commit is contained in:

Infineon\Ouellette

2024-10-24 11:19:28 -07:00

committed by Ouellette Jonathan (CSC FI SPS MESLEO)

parent f2a8ce4116

commit 9651c48539

22 changed files with 10609 additions and 9 deletions

Show all changes Ignore whitespace when comparing lines Ignore changes in amount of whitespace Ignore changes in whitespace at EOL

Download Patch File Download Diff File Expand all files Collapse all files

3214

LSL2/OIWIN/NDW_LOG_TEST_WAFER_USAGE.json Normal file

File diff suppressed because it is too large Load Diff

1912

LSL2/OIWIN/NDW_TW_LOT_CREATE.json Normal file

File diff suppressed because it is too large Load Diff

2592

LSL2/OIWIN/NDW_VIEW_LOT.json Normal file

File diff suppressed because it is too large Load Diff

1004

LSL2/OIWIN/TW_LOT_CREATE.json Normal file

File diff suppressed because it is too large Load Diff