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Updated Metrology_Services to support importing Tencor data into CLEAN_INSP records associated with WM_OUT lots.

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This commit is contained in:
Infineon\StieberD
2025-11-11 16:32:44 -07:00
parent 169fabdac6
commit 77d2f5f6ab
2 changed files with 240 additions and 196 deletions
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14
LSL2/STPROC/QA_SERVICES.txt
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@ -1012,7 +1012,7 @@ Service GetSODPerWafer(RDSKey, TencorRecipe, ScanDTM)
If RDSKey NE '' and TencorRecipe NE '' then
If Num(ScanDTM) then ScanDTM = OConv(ScanDTM, 'DT/^S')
Query = "DECLARE @RDS varchar(10) "
Query = "DECLARE @RDS varchar(255) "
Query := "DECLARE @RECIPE varchar(30) "
Query := "DECLARE @INSERT_DT datetime "
Query := "SET @RDS = '":RDSKey:"' "
@ -1199,7 +1199,7 @@ Service ProcessWaferImageRequests()
PSN = Xlate('RDS', RDSNo, 'PROD_SPEC_ID', 'X')
// Format Wafer Number for SQL Query
WaferNo = Fmt(TrimF(WaferNo), 'R(0)#2')
Query = "DECLARE @RDS varchar(10) " |
Query = "DECLARE @RDS varchar(255) " |
: "DECLARE @RECIPE varchar(30) " |
: "DECLARE @WFRID varchar(10) " |
: "SET @RDS = '":RDSNo:"' " |
@ -3833,13 +3833,3 @@ ClearCursors:
return