Various bug fixes with scanner, form validation within the adjust lot qty form, and added scroll bars on the view lot form

This commit is contained in:
Infineon\Ouellette
2025-02-11 15:25:57 -07:00
parent 76915aff9a
commit 5e00026748
7 changed files with 320 additions and 195 deletions

View File

@ -23,7 +23,6 @@ Return EventFlow or 1
//-----------------------------------------------------------------------------
Event WINDOW.CREATE(CreateParam)
PlaceDialog(-2, -2)
Set_Property(@Window, 'VISIBLE', 1)
NewTWSystemActive = XLATE('APP_INFO', 'NEW_TW_SYSTEM_ACTIVE_SWITCH', 1, 'X')
@ -237,13 +236,15 @@ Event PUB_SUBMIT.CLICK()
If Quantity NE '' AND TWLot NE '' then
if Num(Quantity) then
Begin Case
Case Quantity GT 0 AND Quantity LT 25
Case Quantity GT 0 AND Quantity LE 25
TWLots<1, -1> = TWRow<1,1>
TWLotQtys<1, -1> = TWRow<1,3>
Case Quantity GT 25
NotReadyReason := 'Quantity value for test wafer lot ' : TWLot : ' must be less than 25.' : CRLF$
Case Quantity LE 0
NotReadyReason := 'Quantity value for test wafer lot ' : TWLot : ' must be greater than 0.' : CRLF$
Case Otherwise$
NotReadyReason := 'Quantity value for test wafer lot ' : TWLot : ' is invalid.' : CRLF$
End Case
end else
NotReadyReason := 'Quantity value for test wafer lot ' : TWLot : ' must be a number' : CRLF$
@ -251,7 +252,6 @@ Event PUB_SUBMIT.CLICK()
end else
NotReadyReason := 'A quantity of test wafers used is required for test wafer lot ' : TWLot : CRLF$
end
Next TWRow
If NotReadyReason EQ '' then
TRWaferKey = Test_Run_Services('CreateTestRunRecord', SelRunTypeID, SelEquipType, EquipmentID, RelatedPSN, RelatedRDS, @User4, TWLots, TWLotQtys)