oi-metrology/Wafer-Counter/Repositories/AppSettingsRepository.cs
Mike Phares 6f52566fc2 Dynamic 5 and 14 point copy
AppSettings alignment with other projects

_TestContextTestName over _TestContext
2025-05-02 15:22:18 -07:00

31 lines
955 B
C#

using OI.Metrology.Wafer.Counter.Models;
using OI.Metrology.Shared.Models.Stateless;
namespace OI.Metrology.Wafer.Counter.Repository;
public class AppSettingsRepository : IAppSettingsRepository<AppSettings>
{
private readonly AppSettings _AppSettings;
public AppSettingsRepository(AppSettings appSettings) =>
_AppSettings = appSettings;
internal AppSettings GetAppSettings() =>
_AppSettings;
AppSettings IAppSettingsRepository<AppSettings>.GetAppSettings() => GetAppSettings();
internal string GetBuildNumberAndGitCommitSeven()
{
string result = string.Concat(_AppSettings.BuildNumber, '-', _AppSettings.GitCommitSeven);
return result;
}
string IAppSettingsRepository<AppSettings>.GetBuildNumberAndGitCommitSeven() =>
GetBuildNumberAndGitCommitSeven();
void IAppSettingsRepository<AppSettings>.VerifyConnectionStrings() =>
throw new NotImplementedException();
}