Infineon.EAF.Runtime v2.59.0
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45
Adaptation/_Tests/Extract/Production/v2.59.0/CDE6-EQPT.cs
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45
Adaptation/_Tests/Extract/Production/v2.59.0/CDE6-EQPT.cs
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#if true
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using Microsoft.VisualStudio.TestTools.UnitTesting;
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using System.Diagnostics;
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using System.Reflection;
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using System.Threading;
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namespace Adaptation._Tests.Extract.Production.v2_59_0;
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[TestClass]
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public class CDE6_EQPT
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{
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#pragma warning disable CA2254
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#pragma warning disable IDE0060
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private static CreateSelfDescription.Production.v2_59_0.CDE6_EQPT _CDE6_EQPT;
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[ClassInitialize]
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public static void ClassInitialize(TestContext testContext)
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{
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CreateSelfDescription.Production.v2_59_0.CDE6_EQPT.ClassInitialize(testContext);
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_CDE6_EQPT = CreateSelfDescription.Production.v2_59_0.CDE6_EQPT.EAFLoggingUnitTesting;
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}
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#if DEBUG
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[Ignore]
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#endif
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[TestMethod]
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public void Production__v2_59_0__CDE6_EQPT__DownloadRsMFile() => _CDE6_EQPT.Production__v2_59_0__CDE6_EQPT__DownloadRsMFile();
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[Ignore]
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[TestMethod]
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public void Production__v2_59_0__CDE6_EQPT__DownloadRsMFile638065099250000000__Normal()
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{
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bool validatePDSF = false;
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string check = "CDE_Logs|WaferMeasurementData.log|.RsM";
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MethodBase methodBase = new StackFrame().GetMethod();
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_CDE6_EQPT.Production__v2_59_0__CDE6_EQPT__DownloadRsMFile();
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_ = _CDE6_EQPT.AdaptationTesting.GetVariables(methodBase, check, validatePDSF);
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for (int i = 0; i < int.MaxValue; i++)
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Thread.Sleep(500);
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}
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}
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#endif
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